Information card for entry 2203487
Chemical name |
Bis(O,O'-di-p-tolyldithiophosphato-κ^2^S,S')nickel(II) |
Formula |
C28 H28 Ni O4 P2 S4 |
Calculated formula |
C28 H28 Ni O4 P2 S4 |
SMILES |
O(c1ccc(cc1)C)P2(=[S][Ni]3(SP(Oc1ccc(cc1)C)(Oc1ccc(cc1)C)=[S]3)S2)Oc1ccc(cc1)C |
Title of publication |
Bis(<i>O,O</i>'-di-<i>p</i>-tolyldithiophosphato-κ^2^<i>S,S</i>')nickel(II) |
Authors of publication |
Zhang, Shu-Shang; Yang, Bo; Wang, Yan-Fang; Li, Xue-Mei; Jiao, Kui; Kassim, Mohammad. B.; Yamin, Bohari. M. |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2004 |
Journal volume |
60 |
Journal issue |
4 |
Pages of publication |
m485 - m486 |
a |
7.1884 ± 0.0011 Å |
b |
9.3158 ± 0.0014 Å |
c |
12.1699 ± 0.0018 Å |
α |
78.605 ± 0.002° |
β |
81.335 ± 0.002° |
γ |
78.557 ± 0.002° |
Cell volume |
777.7 ± 0.2 Å3 |
Cell temperature |
293 ± 2 K |
Ambient diffraction temperature |
293 ± 2 K |
Number of distinct elements |
6 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.033 |
Residual factor for significantly intense reflections |
0.03 |
Weighted residual factors for significantly intense reflections |
0.081 |
Weighted residual factors for all reflections included in the refinement |
0.083 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.04 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2203487.html