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Information card for entry 2203555
Preview
Coordinates | 2203555.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Di-μ-phenylmethanethiolato-μ-sulfido-bis[carbonyl(η^5^- cyclopentadienyl)molybdenum(III)] |
---|---|
Formula | C26 H24 Mo2 O2 S3 |
Calculated formula | C26 H24 Mo2 O2 S3 |
SMILES | [Mo]123456([S]([Mo]789%10([S]1Cc1ccccc1)([S]2)([cH]1[cH]7[cH]8[cH]9[cH]%101)C#[O])Cc1ccccc1)([cH]1[cH]3[cH]4[cH]5[cH]61)C#[O] |
Title of publication | Di-μ-phenylmethanethiolato-μ-sulfido-bis[carbonyl(η^5^-cyclopentadienyl)molybdenum(III)] |
Authors of publication | Wong, Richard Chee Seng; Ooi, Mei Lee; Ng, Seik Weng |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2004 |
Journal volume | 60 |
Journal issue | 5 |
Pages of publication | m690 - m692 |
a | 11.325 ± 0.001 Å |
b | 16.104 ± 0.001 Å |
c | 22.723 ± 0.001 Å |
α | 74.15 ± 0.01° |
β | 86.1 ± 0.01° |
γ | 69.52 ± 0.01° |
Cell volume | 3732.9 ± 0.5 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0996 |
Residual factor for significantly intense reflections | 0.0663 |
Weighted residual factors for significantly intense reflections | 0.1957 |
Weighted residual factors for all reflections included in the refinement | 0.2157 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.067 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2203555.html
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Users of the data should acknowledge the original authors of the
structural data.