Information card for entry 2203736
Chemical name |
(R)-2,2'-Dimethoxy-3,3'-bis{[(1S)-1-phenylethyl]iminomethyl}-1,1'- binaphthalene |
Formula |
C40 H36 N2 O2 |
Calculated formula |
C40 H36 N2 O2 |
SMILES |
O(c1c(cc2ccccc2c1c1c2ccccc2cc(c1OC)/C=N/[C@H](c1ccccc1)C)/C=N/[C@H](c1ccccc1)C)C |
Title of publication |
(<i>R</i>)-2,2'-Dimethoxy-3,3'-bis{[(1<i>S</i>)-1-phenylethyl]iminomethyl}-1,1'-binaphthalene, a new chiral Schiff base |
Authors of publication |
Li, Xingshu; Jia, Xian; Su, Liming; Zhou, Zhongyuan |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2004 |
Journal volume |
60 |
Journal issue |
6 |
Pages of publication |
o998 - o999 |
a |
9.614 ± 0.002 Å |
b |
15.27 ± 0.004 Å |
c |
22.838 ± 0.005 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
3352.8 ± 1.3 Å3 |
Cell temperature |
294 ± 2 K |
Ambient diffraction temperature |
294 ± 2 K |
Number of distinct elements |
4 |
Space group number |
19 |
Hermann-Mauguin space group symbol |
P 21 21 21 |
Hall space group symbol |
P 2ac 2ab |
Residual factor for all reflections |
0.1567 |
Residual factor for significantly intense reflections |
0.0492 |
Weighted residual factors for significantly intense reflections |
0.099 |
Weighted residual factors for all reflections included in the refinement |
0.1182 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.012 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2203736.html