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Information card for entry 2204466
Preview
Coordinates | 2204466.cif |
---|---|
Structure factors | 2204466.hkl |
Original IUCr paper | HTML |
Chemical name | Tetrakis{μ-1-[2-(2-oxidoethylamino)ethyliminomethyl]-2- naphtholato}tetrazinc(II) |
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Formula | C60 H64 N8 O8 Zn4 |
Calculated formula | C60 H64 N8 O8 Zn4 |
SMILES | c12c(ccc3ccccc13)O[Zn]134[N](=C2)CC[NH]1CC[O]3[Zn]123[N](=Cc5c(ccc6ccccc56)O2)CC[NH]1CC[O]3[Zn]123[N](=Cc5c(ccc6ccccc56)O2)CC[NH]1CC[O]3[Zn]123[N](=Cc5c(ccc6ccccc56)O2)CC[NH]1CC[O]43 |
Title of publication | Tetrakis{μ-1-[2-(2-oxidoethylamino)ethyliminomethyl]-2-naphtholato}tetrazinc(II) |
Authors of publication | You, Zhong-Lu; Ma, Ji-Long; Zhu, Hai-Liang; Liu, Wei-Sheng |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2004 |
Journal volume | 60 |
Journal issue | 11 |
Pages of publication | m1599 - m1601 |
a | 18.23 ± 0.003 Å |
b | 18.23 ± 0.003 Å |
c | 8.531 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2835.1 ± 0.9 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 86 |
Hermann-Mauguin space group symbol | P 42/n :2 |
Hall space group symbol | -P 4bc |
Residual factor for all reflections | 0.0557 |
Residual factor for significantly intense reflections | 0.0421 |
Weighted residual factors for significantly intense reflections | 0.0993 |
Weighted residual factors for all reflections included in the refinement | 0.1039 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.97 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2204466.html
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Users of the data should acknowledge the original authors of the
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