Information card for entry 2204803
Chemical name |
μ-3,4,5,6-Tetrafluorophthalato-bis[tris(2-methyl-2-phenylpropyl)tin(IV)] |
Formula |
C68 H78 F4 O4 Sn2 |
Calculated formula |
C68 H78 F4 O4 Sn2 |
SMILES |
C(C(C)(C)c1ccccc1)[Sn](OC(=O)c1c(F)c(F)c(F)c(F)c1C(=O)O[Sn](CC(C)(C)c1ccccc1)(CC(C)(C)c1ccccc1)CC(C)(C)c1ccccc1)(CC(C)(C)c1ccccc1)CC(C)(C)c1ccccc1 |
Title of publication |
μ-3,4,5,6-Tetrafluorophthalato-bis[tris(2-methyl-2-phenylpropyl)tin(IV)] |
Authors of publication |
Tian, Lai-Jin; Sun, Yu-Xi; Ng, Seik Weng |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2004 |
Journal volume |
60 |
Journal issue |
12 |
Pages of publication |
m1752 - m1753 |
a |
14.4124 ± 0.0006 Å |
b |
12.583 ± 0.0006 Å |
c |
17.9361 ± 0.0008 Å |
α |
90° |
β |
104.833 ± 0.001° |
γ |
90° |
Cell volume |
3144.3 ± 0.2 Å3 |
Cell temperature |
295 ± 2 K |
Ambient diffraction temperature |
295 ± 2 K |
Number of distinct elements |
5 |
Space group number |
5 |
Hermann-Mauguin space group symbol |
C 1 2 1 |
Hall space group symbol |
C 2y |
Residual factor for all reflections |
0.032 |
Residual factor for significantly intense reflections |
0.028 |
Weighted residual factors for significantly intense reflections |
0.065 |
Weighted residual factors for all reflections included in the refinement |
0.068 |
Goodness-of-fit parameter for all reflections included in the refinement |
0.99 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2204803.html