Information card for entry 2205393
| Chemical name |
3,6-Diphenyl-1,4-bis(tolyl-4-sulfonyl)-1,4-dihydro-1,2,4,5-tetrazine |
| Formula |
C28 H24 N4 O4 S2 |
| Calculated formula |
C28 H24 N4 O4 S2 |
| SMILES |
S(=O)(=O)(N1N=C(N(S(=O)(=O)c2ccc(cc2)C)N=C1c1ccccc1)c1ccccc1)c1ccc(cc1)C |
| Title of publication |
3,6-Diphenyl-1,4-bis(<i>p</i>-tolylsulfonyl)-1,4-dihydro-1,2,4,5-tetrazine |
| Authors of publication |
Luping Lv; Weixiao Hu; Hai-Bo Shi; Guo-Wu Rao |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2005 |
| Journal volume |
61 |
| Journal issue |
4 |
| Pages of publication |
o1026 - o1027 |
| a |
10.801 ± 0.0017 Å |
| b |
14.279 ± 0.004 Å |
| c |
18.074 ± 0.003 Å |
| α |
90° |
| β |
103.23 ± 0.013° |
| γ |
90° |
| Cell volume |
2713.5 ± 1 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0881 |
| Residual factor for significantly intense reflections |
0.0374 |
| Weighted residual factors for significantly intense reflections |
0.0979 |
| Weighted residual factors for all reflections included in the refinement |
0.1182 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.005 |
| Diffraction radiation wavelength |
0.71065 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2205393.html