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Information card for entry 2205436
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| Coordinates | 2205436.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | (Bis(diphenylphosphino)ethane)dichloro(oxo)methoxorhenium(V) |
|---|---|
| Formula | C28 H29 Cl4 O2 P2 Re |
| Calculated formula | C27 H27 Cl2 O2 P2 Re |
| SMILES | [Re]1(Cl)(Cl)([P](c2ccccc2)(c2ccccc2)CC[P]1(c1ccccc1)c1ccccc1)(=O)OC |
| Title of publication | [1,2-Bis(diphenylphosphino)ethane]dichloro(methoxo)oxorhenium(V) dichloromethane solvate |
| Authors of publication | André L. Beauchamp; Sigouin, Olivier |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2005 |
| Journal volume | 61 |
| Journal issue | 4 |
| Pages of publication | m736 - m737 |
| a | 11.3352 ± 0.0001 Å |
| b | 20.4411 ± 0.0001 Å |
| c | 13.9594 ± 0.0001 Å |
| α | 90° |
| β | 108.303 ± 0.001° |
| γ | 90° |
| Cell volume | 3070.81 ± 0.04 Å3 |
| Cell temperature | 223 ± 2 K |
| Ambient diffraction temperature | 223 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.052 |
| Residual factor for significantly intense reflections | 0.0466 |
| Weighted residual factors for significantly intense reflections | 0.1198 |
| Weighted residual factors for all reflections included in the refinement | 0.122 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.107 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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