Information card for entry 2205491
| Chemical name |
Bis(tetraethylammonium) bis(2-thioxo-1,3-dithiole-4,5-dithiolato)copper(II) |
| Formula |
C22 H40 Cu N2 S10 |
| Calculated formula |
C22 H40 Cu N2 S10 |
| SMILES |
C1(=S)SC2S[Cu]3(SC=2S1)SC1=C(S3)SC(=S)S1.C(C)[N+](CC)(CC)CC.C(C)[N+](CC)(CC)CC |
| Title of publication |
Bis(tetraethylammonium) bis(2-thioxo-1,3-dithiole-4,5-dithiolato)cuprate(II) |
| Authors of publication |
Wang, Xin-Qiang; Yu, Wen-Tao; Xu, Dong; Wang, Yan-Ling; Li, Ting-Bin; Zhang, Guang-Hui; Sun, Xiang-Bin; Ren, Quan |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2005 |
| Journal volume |
61 |
| Journal issue |
4 |
| Pages of publication |
m717 - m719 |
| a |
26.88 ± 0.004 Å |
| b |
8.009 ± 0.0011 Å |
| c |
18.294 ± 0.003 Å |
| α |
90° |
| β |
123.836 ± 0.008° |
| γ |
90° |
| Cell volume |
3271.3 ± 0.9 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
9 |
| Hermann-Mauguin space group symbol |
C 1 c 1 |
| Hall space group symbol |
C -2yc |
| Residual factor for all reflections |
0.1071 |
| Residual factor for significantly intense reflections |
0.0506 |
| Weighted residual factors for significantly intense reflections |
0.096 |
| Weighted residual factors for all reflections included in the refinement |
0.1184 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.953 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2205491.html