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Information card for entry 2206150
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Coordinates | 2206150.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Bis(trimethylaminium) hexaaquazinc(II) bis(naphthalene-1,6-disulfonate) |
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Formula | C32 H56 N2 O18 S4 Zn |
Calculated formula | C32 H56 N2 O18 S4 Zn |
SMILES | [NH+](CC)(CC)CC.c1(cccc2cc(ccc12)S(=O)(=O)[O-])S(=O)(=O)[O-].[Zn]([OH2])([OH2])([OH2])([OH2])([OH2])[OH2].[NH+](CC)(CC)CC.c1(cccc2cc(ccc12)S(=O)(=O)[O-])S(=O)(=O)[O-] |
Title of publication | Bis(triethylaminium) hexaaquazinc(II) bis(naphthalene-1,6-disulfonate) |
Authors of publication | Wei-Guang San; Hai Feng; Li Li; Zhi-Min Jin; Mao-Lin Hu |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2005 |
Journal volume | 61 |
Journal issue | 7 |
Pages of publication | m1363 - m1365 |
a | 7.078 ± 0.001 Å |
b | 11.597 ± 0.002 Å |
c | 13.924 ± 0.002 Å |
α | 77.89 ± 0.01° |
β | 75.41 ± 0.01° |
γ | 79.35 ± 0.01° |
Cell volume | 1070.9 ± 0.3 Å3 |
Cell temperature | 289 ± 2 K |
Ambient diffraction temperature | 289 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0476 |
Residual factor for significantly intense reflections | 0.0366 |
Weighted residual factors for significantly intense reflections | 0.1022 |
Weighted residual factors for all reflections included in the refinement | 0.1061 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.098 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2206150.html
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