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Information card for entry 2207147
Preview
Coordinates | 2207147.cif |
---|---|
Structure factors | 2207147.hkl |
Original IUCr paper | HTML |
Chemical name | Bis[tris(ethylenediamine)manganese(II)] di-μ-tellurido-bis[ditelluridostannate(IV)] |
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Formula | C12 H48 Mn2 N12 Sn2 Te6 |
Calculated formula | C12 H48 Mn2 N12 Sn2 Te6 |
SMILES | C1C[NH2][Mn]23([NH2]1)([NH2]CC[NH2]2)[NH2]CC[NH2]3.[Sn]1([Te-])([Te][Sn]([Te-])([Te]1)[Te-])[Te-].C1C[NH2][Mn]23([NH2]1)([NH2]CC[NH2]2)[NH2]CC[NH2]3 |
Title of publication | Bis[tris(ethylenediamine)manganese(II)] di-μ-tellurido-bis[ditelluridostannate(IV)] (monoclinic modification) |
Authors of publication | Anna Kromm; William S. Sheldrick |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2005 |
Journal volume | 61 |
Journal issue | 11 |
Pages of publication | m2234 - m2236 |
a | 9.1006 ± 0.0018 Å |
b | 18.019 ± 0.004 Å |
c | 12.701 ± 0.003 Å |
α | 90° |
β | 95.23 ± 0.03° |
γ | 90° |
Cell volume | 2074.1 ± 0.8 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0467 |
Residual factor for significantly intense reflections | 0.0365 |
Weighted residual factors for significantly intense reflections | 0.1032 |
Weighted residual factors for all reflections included in the refinement | 0.1063 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.382 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2207147.html
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Users of the data should acknowledge the original authors of the
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