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Information card for entry 2207329
Preview
Coordinates | 2207329.cif |
---|---|
Structure factors | 2207329.hkl |
Original IUCr paper | HTML |
Chemical name | Di-μ-furan-2-selenolato-bis[(furan-2-selenolato)(triphenylphosphine)palladium] |
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Formula | C52 H42 O4 P2 Pd2 Se4 |
Calculated formula | C52 H42 O4 P2 Pd2 Se4 |
SMILES | o1c(ccc1)[Se][Pd]1([Se](c2ccco2)[Pd]([P](c2ccccc2)(c2ccccc2)c2ccccc2)([Se]c2occc2)[Se]1c1occc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Di-μ-furan-2-selenolato-bis[(furan-2-selenolato)(triphenylphosphine)palladium(II)] |
Authors of publication | Wagner, Andreas; Hannu-Kuure, Milja S.; Oilunkaniemi, Raija; Laitinen, Risto S. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2005 |
Journal volume | 61 |
Journal issue | 11 |
Pages of publication | m2198 - m2200 |
a | 13.045 ± 0.003 Å |
b | 16.394 ± 0.003 Å |
c | 12.233 ± 0.002 Å |
α | 90° |
β | 110.85 ± 0.03° |
γ | 90° |
Cell volume | 2444.8 ± 1 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0538 |
Residual factor for significantly intense reflections | 0.0416 |
Weighted residual factors for significantly intense reflections | 0.0945 |
Weighted residual factors for all reflections included in the refinement | 0.1018 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2207329.html
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