Information card for entry 2207444
| Chemical name |
(E,E)-4-(4-Nitrophenylethenyl)-1-(2,4,6-trimethoxyphenylethenyl)benzene |
| Formula |
C25 H23 N O5 |
| Calculated formula |
C25 H23 N O5 |
| SMILES |
O(c1c(c(OC)cc(OC)c1)/C=C/c1ccc(cc1)/C=C/c1ccc(N(=O)=O)cc1)C |
| Title of publication |
(<i>E</i>,<i>E</i>)-1-[2-(4-Nitrophenyl)ethenyl]-4-[2-(2,4,6-trimethoxyphenyl)ethenyl]benzene |
| Authors of publication |
Vande Velde, Christophe M. L.; De Borger, Roeland; Blockhuys, Frank |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2005 |
| Journal volume |
61 |
| Journal issue |
12 |
| Pages of publication |
o4289 - o4291 |
| a |
15.785 ± 0.005 Å |
| b |
10.357 ± 0.002 Å |
| c |
13.502 ± 0.001 Å |
| α |
90° |
| β |
105.96 ± 0.02° |
| γ |
90° |
| Cell volume |
2122.3 ± 0.8 Å3 |
| Cell temperature |
287 ± 2 K |
| Ambient diffraction temperature |
287 ± 2 K |
| Number of distinct elements |
4 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0977 |
| Residual factor for significantly intense reflections |
0.0395 |
| Weighted residual factors for significantly intense reflections |
0.0992 |
| Weighted residual factors for all reflections included in the refinement |
0.1214 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.032 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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