Information card for entry 2207804
Chemical name |
Pentacyclo[5.4.0.0^2,6^.0^3,10^.0^5,9^]undecane-8-11-dione ethylene acetal |
Formula |
C13 H14 O3 |
Calculated formula |
C13 H14 O3 |
SMILES |
O1C2(OCC1)[C@@H]1[C@H]3C[C@H]4[C@@H]1C(=O)[C@@H]1[C@H]4[C@H]3[C@H]21.O1C2(OCC1)[C@H]1[C@@H]3C[C@@H]4[C@H]1C(=O)[C@H]1[C@@H]4[C@@H]3[C@@H]21 |
Title of publication |
Pentacyclo[5.4.0.0^2,6^.0^3,10^.0^5,9^]undecane-8,11-dione ethylene acetal |
Authors of publication |
Kruger, Hendrik G.; Rademeyer, Melanie; Ramdhani, Reshika |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2006 |
Journal volume |
62 |
Journal issue |
1 |
Pages of publication |
o268 - o270 |
a |
24.7387 ± 0.001 Å |
b |
6.634 ± 0.0003 Å |
c |
12.7631 ± 0.0005 Å |
α |
90° |
β |
107.914 ± 0.002° |
γ |
90° |
Cell volume |
1993.09 ± 0.15 Å3 |
Cell temperature |
173 ± 2 K |
Ambient diffraction temperature |
173 ± 2 K |
Number of distinct elements |
3 |
Space group number |
15 |
Hermann-Mauguin space group symbol |
C 1 2/c 1 |
Hall space group symbol |
-C 2yc |
Residual factor for all reflections |
0.0715 |
Residual factor for significantly intense reflections |
0.0622 |
Weighted residual factors for significantly intense reflections |
0.1645 |
Weighted residual factors for all reflections included in the refinement |
0.172 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.055 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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