Information card for entry 2208548
Chemical name |
(-)-Menthyl (S~P~,R~S~)-(2-p-tolylsulfinylethyl)phenylphosphinate |
Formula |
C25 H35 O3 P S |
Calculated formula |
C25 H35 O3 P S |
SMILES |
S(=O)(CC[P@@](=O)(O[C@H]1[C@@H](CC[C@H](C1)C)C(C)C)c1ccccc1)c1ccc(cc1)C |
Title of publication |
({-})-Menthyl (<i>S</i>~P~,<i>R</i>~S~)-(2-<i>p</i>-tolylsulfinylethyl)phenylphosphinate |
Authors of publication |
Osiński, Piotr W.; Saadi, Jakub; Ricken, Stefan; Schürmann, Markus; Preut, Hans; Pietrusiewicz, Michal; Eilbracht, Peter |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2006 |
Journal volume |
62 |
Journal issue |
4 |
Pages of publication |
o1248 - o1249 |
a |
5.6199 ± 0.0011 Å |
b |
16.824 ± 0.003 Å |
c |
26.87 ± 0.005 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
2540.5 ± 0.8 Å3 |
Cell temperature |
291 ± 1 K |
Ambient diffraction temperature |
291 ± 1 K |
Number of distinct elements |
5 |
Space group number |
19 |
Hermann-Mauguin space group symbol |
P 21 21 21 |
Hall space group symbol |
P 2ac 2ab |
Residual factor for all reflections |
0.1406 |
Residual factor for significantly intense reflections |
0.0323 |
Weighted residual factors for significantly intense reflections |
0.0598 |
Weighted residual factors for all reflections included in the refinement |
0.0822 |
Goodness-of-fit parameter for all reflections included in the refinement |
0.894 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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