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Information card for entry 2208693
Preview
Coordinates | 2208693.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Hexadecyltrimethylammonium bis(2-thioxo-1,3-dithiole-4,5-dithiolato-κ^2^S^4^,S^5^)nickel(III) |
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Formula | C25 H42 N Ni S10 |
Calculated formula | C25 H42 N Ni S10 |
SMILES | C1(=S)SC2=C(S1)S[Ni]1(S2)SC2=C(S1)SC(=S)S2.CCCCCCCCCCCCCCCC[N+](C)(C)C |
Title of publication | Hexadecyltrimethylammonium bis(2-thioxo-1,3-dithiole-4,5-dithiolato-κ^2^<i>S</i>^4^,<i>S</i>^5^)nickelate(III) |
Authors of publication | Wang, Yan-Ling; Xu, Dong; Yu, Wen-Tao; Wang, Xin-Qiang; Zhang, Guang-Hui |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2006 |
Journal volume | 62 |
Journal issue | 4 |
Pages of publication | m757 - m759 |
a | 8.051 ± 0.005 Å |
b | 12.24 ± 0.005 Å |
c | 18.316 ± 0.005 Å |
α | 93.426 ± 0.005° |
β | 99.218 ± 0.005° |
γ | 100.494 ± 0.005° |
Cell volume | 1744.5 ± 1.4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.073 |
Residual factor for significantly intense reflections | 0.0523 |
Weighted residual factors for significantly intense reflections | 0.1367 |
Weighted residual factors for all reflections included in the refinement | 0.1552 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.021 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2208693.html
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Users of the data should acknowledge the original authors of the
structural data.