Information card for entry 2209233
Chemical name |
Poly[(O-ethyl dithiocarbonate-κ3S,S',O)(1,10-phenanthroline-κ2N,N')potassium(I)] |
Formula |
C15 H13 K N2 O S2 |
Calculated formula |
C15 H13 K N2 O S2 |
SMILES |
[K+].S=C([S-])OCC.n1cccc2ccc3cccnc3c12 |
Title of publication |
Poly[(μ~3~-<i>O</i>-ethyl dithiocarbonato-κ^5^<i>O</i>,<i>S</i>:<i>S</i>,<i>S</i>':<i>S</i>')[(1,10-phenanthroline-κ^2^<i>N</i>,<i>N</i>')potassium(I)]] |
Authors of publication |
Nair, Sreekumari P.; Mirkovic, Tihana; Scholes, Gregory D.; Lough, Alan J. |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2006 |
Journal volume |
62 |
Journal issue |
6 |
Pages of publication |
m1317 - m1319 |
a |
6.7148 ± 0.0005 Å |
b |
10.5307 ± 0.0007 Å |
c |
12.2614 ± 0.0009 Å |
α |
64.58 ± 0.003° |
β |
89.405 ± 0.004° |
γ |
80.336 ± 0.005° |
Cell volume |
770.12 ± 0.1 Å3 |
Cell temperature |
150 ± 1 K |
Ambient diffraction temperature |
150 ± 1 K |
Number of distinct elements |
6 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.0895 |
Residual factor for significantly intense reflections |
0.0545 |
Weighted residual factors for significantly intense reflections |
0.1344 |
Weighted residual factors for all reflections included in the refinement |
0.1577 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.04 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2209233.html