Crystallography Open Database

Information card for entry 2209281

2209280 << 2209281 >> 2209282

Preview

Structure parameters

Common name	Si(Ar''')4
Chemical name	Tetrakis[3,5-bis(trifluoromethyl)phenyl]silane
Formula	C32 H12 F24 Si
Calculated formula	C32 H12 F24 Si
SMILES	c1(cc(cc(c1)C(F)(F)F)C(F)(F)F)[Si](c1cc(cc(c1)C(F)(F)F)C(F)(F)F)(c1cc(cc(c1)C(F)(F)F)C(F)(F)F)c1cc(cc(c1)C(F)(F)F)C(F)(F)F
Title of publication	Tetrakis[3,5-bis(trifluoromethyl)phenyl]silane
Authors of publication	Agnew, Caroline; Dillon, Keith B.; Goeta, Andrés E.; Thompson, Amber L.
Journal of publication	Acta Crystallographica Section E
Year of publication	2006
Journal volume	62
Journal issue	6
Pages of publication	o2344 - o2346
a	18.376 ± 0.0004 Å
b	9.5325 ± 0.0002 Å
c	18.7776 ± 0.0004 Å
α	90°
β	100.388 ± 0.001°
γ	90°
Cell volume	3235.34 ± 0.12 Å³
Cell temperature	120 ± 2 K
Ambient diffraction temperature	120 ± 2 K
Number of distinct elements	4
Space group number	13
Hermann-Mauguin space group symbol	P 1 2/c 1
Hall space group symbol	-P 2yc
Residual factor for all reflections	0.0823
Residual factor for significantly intense reflections	0.0514
Weighted residual factors for significantly intense reflections	0.1344
Weighted residual factors for all reflections included in the refinement	0.1577
Goodness-of-fit parameter for all reflections included in the refinement	1.02
Diffraction radiation wavelength	0.71073 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	Yes

For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2209281.html