Information card for entry 2209622
Chemical name |
18,24-bis(p-tolylsulfonamide)-2,5,8,11,21-pentaoxa-15,27-dithia-18,24- diazatricyclo[24.3.0.0]nonacosa-1(26),12(16),13,28-tetraene |
Formula |
C34 H42 N2 O9 S4 |
Calculated formula |
C34 H42 N2 O9 S4 |
SMILES |
s1c2c(OCCOCCOCCOc3c(scc3)CN(S(=O)(=O)c3ccc(cc3)C)CCOCCN(S(=O)(=O)c3ccc(cc3)C)C2)cc1 |
Title of publication |
A thiophene-based azacryptand Mannich base: 18,24-bis(<i>p</i>-tolylsulfonamido)-2,5,8,11,21-pentaoxa-15,27-dithia-18,24-diazatricyclo[24.3.0.0]nonacosa-1(26),12(16),13,28-tetraene |
Authors of publication |
Gaël Labat; Joan Halfpenny |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2006 |
Journal volume |
62 |
Journal issue |
7 |
Pages of publication |
o3087 - o3089 |
a |
18.2875 ± 0.0013 Å |
b |
9.091 ± 0.0005 Å |
c |
22.6813 ± 0.0017 Å |
α |
90° |
β |
105.619 ± 0.009° |
γ |
90° |
Cell volume |
3631.6 ± 0.5 Å3 |
Cell temperature |
153 ± 2 K |
Ambient diffraction temperature |
153 ± 2 K |
Number of distinct elements |
5 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/c 1 |
Hall space group symbol |
-P 2ybc |
Residual factor for all reflections |
0.072 |
Residual factor for significantly intense reflections |
0.0434 |
Weighted residual factors for significantly intense reflections |
0.0995 |
Weighted residual factors for all reflections included in the refinement |
0.1075 |
Goodness-of-fit parameter for all reflections included in the refinement |
0.876 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2209622.html