Information card for entry 2209781

Structure parameters

• Formula: C32 H80 N4 S16 Sn2 W4
• Calculated formula: C32 H80 N4 S16 Sn2 W4
• SMILES: [N+](CC)(CC)(CC)CC.[N+](CC)(CC)(CC)CC.[N+](CC)(CC)(CC)CC.[N+](CC)(CC)(CC)CC.S=[W]1(=S)S[Sn]2(S1)S[W](=S)(=S)S[Sn]1(S[W](=S)(=S)S1)S[W](=S)(=S)S2
• Title of publication: Tetrakis(tetraethylammonium) tetrakis(tetrathiotungstenio)distannate(II)
• Authors of publication: Wang, Qing-Hua
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2006
• Journal volume: 62
• Journal issue: 8
• Pages of publication: m1936 - m1937
• a: 12.507 ± 0.002 Å
• b: 13.188 ± 0.003 Å
• c: 19.937 ± 0.006 Å
• α: 90°
• β: 106.19 ± 0.05°
• γ: 90°
• Cell volume: 3158 ± 1.5 ų
• Cell temperature: 292 ± 2 K
• Ambient diffraction temperature: 292 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.068
• Residual factor for significantly intense reflections: 0.0578
• Weighted residual factors for significantly intense reflections: 0.1523
• Weighted residual factors for all reflections included in the refinement: 0.1579
• Goodness-of-fit parameter for all reflections included in the refinement: 1.031
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes