Information card for entry 2211698
Chemical name |
Tris(nitrato-κ^2^O,O')bis(1,10-phenanthroline-κ^2^N,N')ytterbium(III) |
Formula |
C24 H16 N7 O9 Yb |
Calculated formula |
C24 H16 N7 O9 Yb |
SMILES |
c1ccc2c3c4c(ccc[n]4[Yb]4567(ON(=[O]4)=O)(ON(=[O]6)=O)([n]13)(ON(=[O]5)=O)[n]1cccc3c1c1c(ccc[n]71)cc3)cc2 |
Title of publication |
Tris(nitrato-κ^2^<i>O</i>,<i>O</i>')bis(1,10-phenanthroline-κ^2^<i>N</i>,<i>N</i>')ytterbium(III) |
Authors of publication |
Liu, Y.-F.; Xia, H.-T.; Yang, S.-P.; Wang, D.-Q. |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2007 |
Journal volume |
63 |
Journal issue |
1 |
Pages of publication |
m12 - m14 |
a |
9.456 ± 0.002 Å |
b |
15.451 ± 0.003 Å |
c |
17.104 ± 0.003 Å |
α |
90° |
β |
93.687 ± 0.002° |
γ |
90° |
Cell volume |
2493.8 ± 0.8 Å3 |
Cell temperature |
298 ± 2 K |
Ambient diffraction temperature |
298 ± 2 K |
Number of distinct elements |
5 |
Space group number |
15 |
Hermann-Mauguin space group symbol |
C 1 2/c 1 |
Hall space group symbol |
-C 2yc |
Residual factor for all reflections |
0.0403 |
Residual factor for significantly intense reflections |
0.0328 |
Weighted residual factors for significantly intense reflections |
0.0748 |
Weighted residual factors for all reflections included in the refinement |
0.0787 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.04 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2211698.html