Information card for entry 2211873

Structure parameters

• Chemical name: Tetrakis(μ-2-anilinobenzoato-κ^2^O:O')bis[(N,N'-dimethylformamide- κO)copper(II)]
• Formula: C58 H54 Cu2 N6 O10
• Calculated formula: C58 H54 Cu2 N6 O10
• SMILES: c1(Nc2ccccc2)c(C2=[O][Cu]345([O]=C(O[Cu]5([O]=C(c5ccccc5Nc5ccccc5)O3)(O2)([O]=C(O4)c2ccccc2Nc2ccccc2)[O]=CN(C)C)c2ccccc2Nc2ccccc2)[O]=CN(C)C)cccc1
• Title of publication: Tetrakis(μ-2-anilinobenzoato-κ^2^<i>O</i>:<i>O</i>')bis[(<i>N</i>,<i>N</i>-dimethylformamide-κ<i>O</i>)copper(II)]
• Authors of publication: Wu, Ming-Yan; Huang, You-Gui; Wei, Wei; Gao, Qiang; Hong, Mao-Chun
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2007
• Journal volume: 63
• Journal issue: 1
• Pages of publication: m94 - m96
• a: 14.1539 ± 0.0003 Å
• b: 11.044 ± 0.0002 Å
• c: 17.8517 ± 0.0001 Å
• α: 90°
• β: 104.24 ± 0.0004°
• γ: 90°
• Cell volume: 2704.76 ± 0.08 ų
• Cell temperature: 298 ± 2 K
• Ambient diffraction temperature: 298 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for significantly intense reflections: 0.0445
• Weighted residual factors for significantly intense reflections: 0.0928
• Weighted residual factors for all reflections included in the refinement: 0.1077
• Goodness-of-fit parameter for all reflections included in the refinement: 1.113
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes