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Information card for entry 2211904
Preview
Coordinates | 2211904.cif |
---|---|
Structure factors | 2211904.hkl |
Original IUCr paper | HTML |
Chemical name | Carbonyl(diethyldithiocarbamato)(η^5^-pentamethylcyclopentadienyl)iridium(III) trifluoromethanesulfonate |
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Formula | C17 H25 F3 Ir N O4 S3 |
Calculated formula | C17 H25 F3 Ir N O4 S3 |
SMILES | [Ir]12345(SC(=[S]1)N(CC)CC)(C#[O])[c]1([c]5([c]4([c]3([c]21C)C)C)C)C.S(=O)(=O)([O-])C(F)(F)F |
Title of publication | Carbonyl(diethyldithiocarbamato)(η^5^-pentamethylcyclopentadienyl)iridium(III) trifluoromethanesulfonate |
Authors of publication | Michael Scharwitz; Tobias van Almsick; William S. Sheldrick |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2007 |
Journal volume | 63 |
Journal issue | 1 |
Pages of publication | m105 - m107 |
a | 8.194 ± 0.004 Å |
b | 12.1398 ± 0.0012 Å |
c | 13.2421 ± 0.0019 Å |
α | 112.061 ± 0.007° |
β | 101.245 ± 0.017° |
γ | 90.47 ± 0.015° |
Cell volume | 1192.5 ± 0.6 Å3 |
Cell temperature | 292 ± 2 K |
Ambient diffraction temperature | 292 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0277 |
Residual factor for significantly intense reflections | 0.0249 |
Weighted residual factors for significantly intense reflections | 0.0617 |
Weighted residual factors for all reflections included in the refinement | 0.0632 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.086 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2211904.html
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Users of the data should acknowledge the original authors of the
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