Information card for entry 2211925
| Chemical name |
(1S,4R)-1,2,3,4,7,7-Hexachloro-5,6-bis(chloromethyl)bicyclo[2.2.1]hept-2,5-diene |
| Formula |
C9 H4 Cl8 |
| Calculated formula |
C9 H4 Cl8 |
| SMILES |
Cl[C@@]12C(=C([C@@](Cl)(C(=C1Cl)Cl)C2(Cl)Cl)CCl)CCl |
| Title of publication |
(1<i>S</i>,4<i>R</i>)-1,2,3,4,7,7-Hexachloro-5,6-bis(chloromethyl)bicyclo[2.2.1]hepta-2,5-diene |
| Authors of publication |
Wilson, Zakiya S.; Davila, Alfonso; McLaughlin, Mark L.; Watkins, Steven F.; Fronczek, Frank R. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
1 |
| Pages of publication |
o303 - o305 |
| a |
8.518 ± 0.001 Å |
| b |
8.518 ± 0.001 Å |
| c |
38.236 ± 0.005 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
2774.3 ± 0.6 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100 K |
| Number of distinct elements |
3 |
| Space group number |
92 |
| Hermann-Mauguin space group symbol |
P 41 21 2 |
| Hall space group symbol |
P 4abw 2nw |
| Residual factor for all reflections |
0.039 |
| Residual factor for significantly intense reflections |
0.025 |
| Weighted residual factors for significantly intense reflections |
0.044 |
| Weighted residual factors for all reflections included in the refinement |
0.045 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.007 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2211925.html