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Information card for entry 2211955
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Coordinates | 2211955.cif |
---|---|
Structure factors | 2211955.hkl |
Original IUCr paper | HTML |
Chemical name | Bis[ethyl 2-cyano-2-(oxidoimino)acetate]bis(ethylenediamine)nickel(II) hexahydrate |
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Formula | C14 H38 N8 Ni O12 |
Calculated formula | C14 H38 N8 Ni O12 |
SMILES | C1[NH2][Ni]2([NH2]CC[NH2]2)([N]#CC(=N\[O-])/C(=O)OCC)([NH2]C1)[N]#C/C(=N\[O-])C(=O)OCC.O.O.O.O.O.O |
Title of publication | Bis[ethyl 2-cyano-2-(oxidoimino)acetate]bis(ethylenediamine)nickel(II) hexahydrate |
Authors of publication | Mikhail P. Azarkh; Nikolay M. Dudarenko; Igor O. Fritsky; Turganbay S. Iskenderov; Jolanta Świątek-Kozłowska |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2007 |
Journal volume | 63 |
Journal issue | 1 |
Pages of publication | m9 - m11 |
a | 6.69 ± 0.001 Å |
b | 8.833 ± 0.002 Å |
c | 11.044 ± 0.002 Å |
α | 83.11 ± 0.03° |
β | 81.19 ± 0.03° |
γ | 75.69 ± 0.03° |
Cell volume | 622.6 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.056 |
Residual factor for significantly intense reflections | 0.046 |
Weighted residual factors for significantly intense reflections | 0.109 |
Weighted residual factors for all reflections included in the refinement | 0.114 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.05 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2211955.html
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Users of the data should acknowledge the original authors of the
structural data.