Information card for entry 2212048
Chemical name |
5,5-Dimethyl-2,2-bis(pentafluorophenyl)-4,4,6,6-tetrakis(trimethylsilyl)- 1,3-dioxa-4,5,6-trisila-2-titanacyclohexane |
Formula |
C26 H42 F10 O2 Si7 Ti |
Calculated formula |
C26 H42 F10 O2 Si7 Ti |
SMILES |
[Ti]1(O[Si]([Si](C)(C)C)([Si]([Si]([Si](C)(C)C)([Si](C)(C)C)O1)(C)C)[Si](C)(C)C)(c1c(F)c(F)c(F)c(F)c1F)c1c(F)c(F)c(F)c(F)c1F |
Title of publication |
5,5-Dimethyl-2,2-bis(pentafluorophenyl)-4,4,6,6-tetrakis(trimethylsilyl)-1,3-dioxa-4,5,6-trisila-2-titanacyclohexane |
Authors of publication |
Krempner, Clemens; Weichert, Katja; Reinke, Helmut |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2007 |
Journal volume |
63 |
Journal issue |
2 |
Pages of publication |
m356 - m357 |
a |
11.3299 ± 0.0002 Å |
b |
19.1104 ± 0.0003 Å |
c |
19.7235 ± 0.0004 Å |
α |
90° |
β |
102.039 ± 0.001° |
γ |
90° |
Cell volume |
4176.58 ± 0.13 Å3 |
Cell temperature |
173 ± 2 K |
Ambient diffraction temperature |
173 ± 2 K |
Number of distinct elements |
6 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/c 1 |
Hall space group symbol |
-P 2ybc |
Residual factor for all reflections |
0.043 |
Residual factor for significantly intense reflections |
0.0364 |
Weighted residual factors for significantly intense reflections |
0.0881 |
Weighted residual factors for all reflections included in the refinement |
0.0985 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.082 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2212048.html