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Information card for entry 2212973
Preview
Coordinates | 2212973.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Bis(tetrahydrofuran-κ<i>O</i>)tris(tri-tert-butoxysiloxy)chromium(III) |
---|---|
Formula | C44 H97 Cr O14 Si3 |
Calculated formula | C44 H97 Cr O14 Si3 |
SMILES | [Cr](O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)(O[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C)([O]1CCCC1)[O]1CCCC1 |
Title of publication | Bis(tetrahydrofuran-κ<i>O</i>)tris(tri-<i>tert</i>-butoxysiloxy)chromium(III) |
Authors of publication | Ciborska, Anna; Chojnacki, Jaroslaw; Wojnowski, Wieslaw |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2007 |
Journal volume | 63 |
Journal issue | 4 |
Pages of publication | m1103 - m1104 |
a | 13.862 ± 0.003 Å |
b | 16.583 ± 0.003 Å |
c | 13.959 ± 0.003 Å |
α | 90° |
β | 118.27 ± 0.03° |
γ | 90° |
Cell volume | 2826.1 ± 1.3 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0481 |
Residual factor for significantly intense reflections | 0.0465 |
Weighted residual factors for significantly intense reflections | 0.1185 |
Weighted residual factors for all reflections included in the refinement | 0.12 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2212973.html
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Users of the data should acknowledge the original authors of the
structural data.