Information card for entry 2214082

Structure parameters

• Chemical name: tetra-μ~3~-chlorido-[tetrakis(η^5^-pentamethylcyclopentadienyl)ruthenium(II)]
• Formula: C40 H60 Cl4 Ru4
• Calculated formula: C40 H60 Cl4 Ru4
• SMILES: [c]12([c]3([c]4([c]5([c]1([Ru]162345[Cl]2[Ru]34578([c]9([c]3([c]4([c]5([c]79C)C)C)C)C)[Cl]1[Ru]13457([c]9([c]1([c]3([c]4([c]59C)C)C)C)C)[Cl]8[Ru]13452([c]2([c]1([c]3([c]4([c]52C)C)C)C)C)[Cl]67)C)C)C)C)C
• Title of publication: A tetragonal polymorph of tetra-μ~3~-chlorido-tetrakis[(η^5^-pentamethylcyclopentadienyl)ruthenium(II)]
• Authors of publication: Jones, Peter G.; Hrib, Cristian G.; Beer, Stephan; Tamm, Matthias
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2007
• Journal volume: 63
• Journal issue: 7
• Pages of publication: m1785 - m1785
• a: 12.0733 ± 0.0008 Å
• b: 12.0733 ± 0.0008 Å
• c: 14.9611 ± 0.0015 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 2180.8 ± 0.3 ų
• Cell temperature: 133 ± 2 K
• Ambient diffraction temperature: 133 ± 2 K
• Number of distinct elements: 4
• Space group number: 82
• Hermann-Mauguin space group symbol: I -4
• Hall space group symbol: I -4
• Residual factor for all reflections: 0.0289
• Residual factor for significantly intense reflections: 0.0236
• Weighted residual factors for significantly intense reflections: 0.0477
• Weighted residual factors for all reflections included in the refinement: 0.0494
• Goodness-of-fit parameter for all reflections included in the refinement: 1.068
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes