Information card for entry 2214802

Structure parameters

• Chemical name: bis(ethylamine)tetrafluorosilicon
• Formula: C4 H14 F4 N2 Si
• Calculated formula: C4 H14 F4 N2 Si
• SMILES: C(C)[NH2][Si](F)(F)(F)(F)[NH2]CC
• Title of publication: Bis(ethylamino)tetrafluorosilicon
• Authors of publication: Rutt, Oliver J.; Cowley, Andrew R.; Clarke, Simon J.
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2007
• Journal volume: 63
• Journal issue: 8
• Pages of publication: o3406 - o3406
• a: 8.4788 ± 0.0004 Å
• b: 6.9602 ± 0.0003 Å
• c: 7.2206 ± 0.0004 Å
• α: 90°
• β: 99.655 ± 0.002°
• γ: 90°
• Cell volume: 420.08 ± 0.04 ų
• Cell temperature: 150 K
• Ambient diffraction temperature: 150 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0559
• Residual factor for significantly intense reflections: 0.0338
• Weighted residual factors for all reflections: 0.0517
• Weighted residual factors for significantly intense reflections: 0.0422
• Weighted residual factors for all reflections included in the refinement: 0.0422
• Goodness-of-fit parameter for all reflections included in the refinement: 1.071
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes