Information card for entry 2214867
| Chemical name |
[1,4-Bis(diphenylphosphino)butane-κ^2^P,P'](dithiocarbonato-k^2^S,S')nickel(II) |
| Formula |
C29 H28 Ni O P2 S2 |
| Calculated formula |
C29 H28 Ni O P2 S2 |
| SMILES |
[Ni]12([P](CCCC[P]1(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)SC(=O)S2 |
| Title of publication |
[1,4-Bis(diphenylphosphino)butane-κ^2^<i>P</i>,<i>P</i>'](dithiocarbonato-κ^2^<i>S</i>,<i>S</i>')nickel(II) |
| Authors of publication |
Câmpian, Marius V.; Haiduc, Ionel; Semeniuc, Radu F. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
8 |
| Pages of publication |
m2168 - m2168 |
| a |
10.186 ± 0.0005 Å |
| b |
10.6926 ± 0.0006 Å |
| c |
14.5447 ± 0.0008 Å |
| α |
71.906 ± 0.001° |
| β |
82.71 ± 0.001° |
| γ |
64.272 ± 0.001° |
| Cell volume |
1356.46 ± 0.13 Å3 |
| Cell temperature |
294 ± 2 K |
| Ambient diffraction temperature |
294 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.045 |
| Residual factor for significantly intense reflections |
0.038 |
| Weighted residual factors for significantly intense reflections |
0.092 |
| Weighted residual factors for all reflections included in the refinement |
0.097 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.02 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/2214867.html