Information card for entry 2215192
| Chemical name |
cis-Diiodido(N,N,N',N'-tetramethylethylenediamine-κ^2^N,N')platinum(II) |
| Formula |
C6 H16 I2 N2 Pt |
| Calculated formula |
C6 H16 I2 N2 Pt |
| SMILES |
I[Pt]1(I)[N](CC[N]1(C)C)(C)C |
| Title of publication |
<i>cis</i>-Diiodido(<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylethylenediamine-κ^2^<i>N</i>,<i>N</i>')platinum(II) |
| Authors of publication |
Łakomska, Iwona; Dobrzańska, Liliana |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
9 |
| Pages of publication |
m2367 - m2367 |
| a |
7.937 ± 0.007 Å |
| b |
14.733 ± 0.014 Å |
| c |
10.43 ± 0.01 Å |
| α |
90° |
| β |
107.513 ± 0.017° |
| γ |
90° |
| Cell volume |
1163.1 ± 1.9 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0561 |
| Residual factor for significantly intense reflections |
0.047 |
| Weighted residual factors for significantly intense reflections |
0.1014 |
| Weighted residual factors for all reflections included in the refinement |
0.1051 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.07 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2215192.html