Information card for entry 2215316
| Common name |
{3,3'-[ethane-1,2-diylbis(methylimino)]dipropane-1-thiolato}nickel(II) |
| Chemical name |
{3,3'-[ethane-1,2-diylbis(methylimino)]dipropane-1-thiolato}nickel(II) |
| Formula |
C10 H22 N2 Ni S2 |
| Calculated formula |
C10 H22 N2 Ni S2 |
| SMILES |
[Ni]123SCCC[N]2(CC[N]3(CCCS1)C)C |
| Title of publication |
{3,3'-[Ethane-1,2-diylbis(methylimino)]bis(propane-1-thiolato)}nickel(II) |
| Authors of publication |
Grapperhaus, Craig A.; O'Toole, Martin G.; Mashuta, Mark S. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
9 |
| Pages of publication |
m2281 - m2281 |
| a |
8.229 ± 0.0016 Å |
| b |
13.304 ± 0.003 Å |
| c |
11.691 ± 0.002 Å |
| α |
90° |
| β |
92.931 ± 0.003° |
| γ |
90° |
| Cell volume |
1278.2 ± 0.4 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0231 |
| Residual factor for significantly intense reflections |
0.0197 |
| Weighted residual factors for significantly intense reflections |
0.0498 |
| Weighted residual factors for all reflections included in the refinement |
0.0631 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.023 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2215316.html