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Information card for entry 2215392
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Coordinates | 2215392.cif |
---|---|
Original IUCr paper | HTML |
Chemical name | Bis{bis[2-(dimethylaminomethyl)phenyl]hydroxytelluronium} hexafluorosilicate chloroform tetrasolvate |
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Formula | C40 H54 Cl12 F6 N4 O2 Si Te2 |
Calculated formula | C40 H54 Cl12 F6 N4 O2 Si Te2 |
SMILES | c1(ccccc1CN(C)C)[Te+](O)c1ccccc1CN(C)C.[F-][Si](F)(F)(F)(F)[F-].C(Cl)(Cl)Cl.ClC(Cl)Cl.c1(ccccc1CN(C)C)[Te+](O)c1ccccc1CN(C)C.C(Cl)(Cl)Cl.C(Cl)(Cl)Cl |
Title of publication | Bis{bis[2-(dimethylaminomethyl)phenyl]hydroxytelluronium} hexafluorosilicate chloroform tetrasolvate |
Authors of publication | Klapötke, Thomas M.; Krumm, Burkhard; Scherr, Matthias |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2007 |
Journal volume | 63 |
Journal issue | 10 |
Pages of publication | o4189 - o4189 |
a | 9.326 ± 0.0002 Å |
b | 26.7485 ± 0.0005 Å |
c | 12.1579 ± 0.0003 Å |
α | 90° |
β | 112.31 ± 0.003° |
γ | 90° |
Cell volume | 2805.84 ± 0.12 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.029 |
Residual factor for significantly intense reflections | 0.0223 |
Weighted residual factors for significantly intense reflections | 0.0505 |
Weighted residual factors for all reflections included in the refinement | 0.0533 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2215392.html
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