Information card for entry 2216677
| Chemical name |
2<i>H</i>,10<i>H</i>-1,4-Dioxepino[5',6':4,5]thieno[3,2- <i>e</i>][1,4]dioxepine-5,7(3<i>H</i>,9<i>H</i>)-dione |
| Formula |
C10 H8 O6 S |
| Calculated formula |
C10 H8 O6 S |
| Title of publication |
2<i>H</i>,10<i>H</i>-1,4-Dioxepino[5',6':4,5]thieno[3,2-<i>e</i>][1,4]dioxepine-5,7(3<i>H</i>,9<i>H</i>)-dione |
| Authors of publication |
Tomura, Masaaki; Ono, Katsuhiko; Kaiden, Masanori; Tsukamoto, Kenichi; Saito, Katsuhiro |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
12 |
| Pages of publication |
o4568 - o4569 |
| a |
20.301 ± 0.002 Å |
| b |
6.9037 ± 0.0008 Å |
| c |
7.3463 ± 0.0008 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1029.6 ± 0.19 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
62 |
| Hermann-Mauguin space group symbol |
P n m a |
| Hall space group symbol |
-P 2ac 2n |
| Residual factor for all reflections |
0.0679 |
| Residual factor for significantly intense reflections |
0.0656 |
| Weighted residual factors for significantly intense reflections |
0.1493 |
| Weighted residual factors for all reflections included in the refinement |
0.1506 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.121 |
| Diffraction radiation wavelength |
0.7107 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
Yes |
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