Information card for entry 2216765
| Chemical name |
(4S,5S)-4,5-Bis(3-cyclohexyl-2-thioxobenzimidazol-1-ylmethyl)-2,2-dimethyl-\ 1,3-dioxolane |
| Formula |
C33 H42 N4 O2 S2 |
| Calculated formula |
C33 H42 N4 O2 S2 |
| SMILES |
S=C1N(c2ccccc2N1C[C@@H]1OC(O[C@H]1CN1C(=S)N(c2c1cccc2)C1CCCCC1)(C)C)C1CCCCC1 |
| Title of publication |
(4<i>S</i>,5<i>S</i>)-4,5-Bis(3-cyclohexyl-2-thioxobenzimidazol-1-ylmethyl)-2,2-dimethyl-1,3-dioxolane from synchrotron data |
| Authors of publication |
Marshall, Colin; Harrison, William T. A. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
12 |
| Pages of publication |
o4502 - o4502 |
| a |
21.876 ± 0.006 Å |
| b |
10.652 ± 0.003 Å |
| c |
14.12 ± 0.004 Å |
| α |
90° |
| β |
95.398 ± 0.006° |
| γ |
90° |
| Cell volume |
3275.7 ± 1.6 Å3 |
| Cell temperature |
120 ± 2 K |
| Ambient diffraction temperature |
120 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
5 |
| Hermann-Mauguin space group symbol |
C 1 2 1 |
| Hall space group symbol |
C 2y |
| Residual factor for all reflections |
0.08 |
| Residual factor for significantly intense reflections |
0.0549 |
| Weighted residual factors for significantly intense reflections |
0.1174 |
| Weighted residual factors for all reflections included in the refinement |
0.1284 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.996 |
| Diffraction radiation wavelength |
0.6871 Å |
| Diffraction radiation type |
synchrotron |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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