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Information card for entry 2217212
Preview
Coordinates | 2217212.cif |
---|---|
Structure factors | 2217212.hkl |
Original IUCr paper | HTML |
Chemical name | Bis(di-<i>n</i>-propylamine-κ<i>N</i>)bis(tri-<i>tert</i>- butoxysilanethiolato-κ<i>S</i>)chromium(II) |
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Formula | C36 H84 Cr N2 O6 S2 Si2 |
Calculated formula | C36 H84 Cr N2 O6 S2 Si2 |
SMILES | C(C)(C)(C)O[Si](OC(C)(C)C)(OC(C)(C)C)S[Cr]([NH](CCC)CCC)([NH](CCC)CCC)S[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C |
Title of publication | Bis(di-<i>n</i>-propylamine-κ<i>N</i>)bis(tri-<i>tert</i>-butoxysilanethiolato-κ<i>S</i>)chromium(II) |
Authors of publication | Ciborska, Anna; Baranowska, Katarzyna; Wojnowski, Wiesław |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2008 |
Journal volume | 64 |
Journal issue | 1 |
Pages of publication | m46 - m46 |
a | 9.3573 ± 0.0008 Å |
b | 15.6328 ± 0.0012 Å |
c | 16.4333 ± 0.0012 Å |
α | 90° |
β | 93.296 ± 0.007° |
γ | 90° |
Cell volume | 2399.9 ± 0.3 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0601 |
Residual factor for significantly intense reflections | 0.0569 |
Weighted residual factors for significantly intense reflections | 0.1353 |
Weighted residual factors for all reflections included in the refinement | 0.1385 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.068 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2217212.html
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Users of the data should acknowledge the original authors of the
structural data.