Information card for entry 2217212

Structure parameters

• Chemical name: Bis(di-<i>n</i>-propylamine-κ<i>N</i>)bis(tri-<i>tert</i>- butoxysilanethiolato-κ<i>S</i>)chromium(II)
• Formula: C36 H84 Cr N2 O6 S2 Si2
• Calculated formula: C36 H84 Cr N2 O6 S2 Si2
• SMILES: C(C)(C)(C)O[Si](OC(C)(C)C)(OC(C)(C)C)S[Cr]([NH](CCC)CCC)([NH](CCC)CCC)S[Si](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C
• Title of publication: Bis(di-<i>n</i>-propylamine-κ<i>N</i>)bis(tri-<i>tert</i>-butoxysilanethiolato-κ<i>S</i>)chromium(II)
• Authors of publication: Ciborska, Anna; Baranowska, Katarzyna; Wojnowski, Wiesław
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2008
• Journal volume: 64
• Journal issue: 1
• Pages of publication: m46 - m46
• a: 9.3573 ± 0.0008 Å
• b: 15.6328 ± 0.0012 Å
• c: 16.4333 ± 0.0012 Å
• α: 90°
• β: 93.296 ± 0.007°
• γ: 90°
• Cell volume: 2399.9 ± 0.3 ų
• Cell temperature: 120 ± 2 K
• Ambient diffraction temperature: 120 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0601
• Residual factor for significantly intense reflections: 0.0569
• Weighted residual factors for significantly intense reflections: 0.1353
• Weighted residual factors for all reflections included in the refinement: 0.1385
• Goodness-of-fit parameter for all reflections included in the refinement: 1.068
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes