Information card for entry 2217347
| Chemical name |
1-hydroxy-1,1,3,3,3-pentaphenyldisiloxane |
| Formula |
C30 H26 O2 Si2 |
| Calculated formula |
C30 H26 O2 Si2 |
| SMILES |
[Si](O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)(O)(c1ccccc1)c1ccccc1 |
| Title of publication |
1-Hydroxy-1,1,3,3,3-pentaphenyldisiloxane, [Si~2~O(OH)(Ph)~5~], at 100 K |
| Authors of publication |
Coelho, Ana C.; Amarante, Tatiana R.; Klinowski, Jacek; Gonçalves, Isabel S.; Almeida Paz, Filipe A. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2008 |
| Journal volume |
64 |
| Journal issue |
1 |
| Pages of publication |
o237 - o238 |
| a |
10.3611 ± 0.0006 Å |
| b |
14.2844 ± 0.0008 Å |
| c |
18.4367 ± 0.0009 Å |
| α |
99.421 ± 0.004° |
| β |
98.492 ± 0.004° |
| γ |
107.415 ± 0.004° |
| Cell volume |
2511.8 ± 0.3 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.185 |
| Residual factor for significantly intense reflections |
0.072 |
| Weighted residual factors for significantly intense reflections |
0.141 |
| Weighted residual factors for all reflections included in the refinement |
0.185 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.98 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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