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Information card for entry 2217530
Preview
Coordinates | 2217530.cif |
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Structure factors | 2217530.hkl |
Original IUCr paper | HTML |
Chemical name | catena-Poly[[tetrakis(hexamethylphosphoramide-κO)bis(nitrato- κ^2^O,O')lanthanum(III)] [silver(I)-di-μ~2~-sulfido-tungsten(VI)-di-μ~2~-sulfido]] |
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Formula | C24 H72 Ag La N14 O10 P4 S4 W |
Calculated formula | C24 H72 Ag La N14 O10 P4 S4 W |
Title of publication | <i>catena</i>-Poly[[tetrakis(hexamethylphosphoramide-κ<i>O</i>)bis(nitrato-κ^2^<i>O</i>,<i>O</i>')lanthanum(III)] [silver(I)-di-μ~2~-sulfido-tungstate(VI)-di-μ~2~-sulfido]] |
Authors of publication | Tang, Guodong; Zhang, Jinfang; Zhang, Chi; Lu, Lude |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2008 |
Journal volume | 64 |
Journal issue | 2 |
Pages of publication | m399 - m400 |
a | 15.883 ± 0.002 Å |
b | 30.07 ± 0.004 Å |
c | 11.5283 ± 0.0015 Å |
α | 90° |
β | 90.502 ± 0.003° |
γ | 90° |
Cell volume | 5505.7 ± 1.2 Å3 |
Cell temperature | 295 ± 2 K |
Ambient diffraction temperature | 295 ± 2 K |
Number of distinct elements | 9 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0676 |
Residual factor for significantly intense reflections | 0.0589 |
Weighted residual factors for significantly intense reflections | 0.1327 |
Weighted residual factors for all reflections included in the refinement | 0.1373 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.146 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2217530.html
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Users of the data should acknowledge the original authors of the
structural data.