Information card for entry 2218250
| Chemical name |
Bis(η^5^-cyclopentadienyl)bis(2,4,6-trimethylphenyltellurolato)zirconium(IV) |
| Formula |
C28 H32 Te2 Zr |
| Calculated formula |
C28 H32 Te2 Zr |
| SMILES |
[cH]12[cH]3[cH]4[cH]5[cH]1[Zr]16782345([cH]2[cH]1[cH]6[cH]7[cH]82)([Te]c1c(cc(cc1C)C)C)[Te]c1c(cc(cc1C)C)C |
| Title of publication |
Bis(η^5^-cyclopentadienyl)bis(2,4,6-trimethylphenyltellurolato)zirconium(IV) |
| Authors of publication |
Hector, Andrew L.; Levason, William; Reid, Gillian; Reid, Stuart D.; Webster, Michael |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2008 |
| Journal volume |
64 |
| Journal issue |
5 |
| Pages of publication |
m667 |
| a |
9.0483 ± 0.0015 Å |
| b |
21.881 ± 0.006 Å |
| c |
13.806 ± 0.004 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
2733.4 ± 1.2 Å3 |
| Cell temperature |
120 ± 2 K |
| Ambient diffraction temperature |
120 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
41 |
| Hermann-Mauguin space group symbol |
A b a 2 |
| Hall space group symbol |
A 2 -2ab |
| Residual factor for all reflections |
0.0581 |
| Residual factor for significantly intense reflections |
0.0404 |
| Weighted residual factors for significantly intense reflections |
0.0798 |
| Weighted residual factors for all reflections included in the refinement |
0.0873 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.047 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/2218250.html