Information card for entry 2218250
Chemical name |
Bis(η^5^-cyclopentadienyl)bis(2,4,6-trimethylphenyltellurolato)zirconium(IV) |
Formula |
C28 H32 Te2 Zr |
Calculated formula |
C28 H32 Te2 Zr |
SMILES |
[cH]12[cH]3[cH]4[cH]5[cH]1[Zr]16782345([cH]2[cH]1[cH]6[cH]7[cH]82)([Te]c1c(cc(cc1C)C)C)[Te]c1c(cc(cc1C)C)C |
Title of publication |
Bis(η^5^-cyclopentadienyl)bis(2,4,6-trimethylphenyltellurolato)zirconium(IV) |
Authors of publication |
Hector, Andrew L.; Levason, William; Reid, Gillian; Reid, Stuart D.; Webster, Michael |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2008 |
Journal volume |
64 |
Journal issue |
5 |
Pages of publication |
m667 |
a |
9.0483 ± 0.0015 Å |
b |
21.881 ± 0.006 Å |
c |
13.806 ± 0.004 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
2733.4 ± 1.2 Å3 |
Cell temperature |
120 ± 2 K |
Ambient diffraction temperature |
120 ± 2 K |
Number of distinct elements |
4 |
Space group number |
41 |
Hermann-Mauguin space group symbol |
A b a 2 |
Hall space group symbol |
A 2 -2ab |
Residual factor for all reflections |
0.0581 |
Residual factor for significantly intense reflections |
0.0404 |
Weighted residual factors for significantly intense reflections |
0.0798 |
Weighted residual factors for all reflections included in the refinement |
0.0873 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.047 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2218250.html