Information card for entry 2218446
Chemical name |
Tetrakis(1,1,1-trifluoroacetylacetonato-κ^2^O,O')hafnium(IV) toluene disolvate |
Formula |
C34 H32 F12 Hf O8 |
Calculated formula |
C34 H32 F12 Hf O8 |
SMILES |
C1=C(C)O[Hf]234([O]=C1C(F)(F)F)([O]=C(C)C=C(O2)C(F)(F)F)(OC(=CC(C(F)(F)F)=[O]3)C)[O]=C(C)C=C(O4)C(F)(F)F.Cc1ccccc1.Cc1ccccc1 |
Title of publication |
Tetrakis(1,1,1-trifluoroacetylacetonato-κ^2^<i>O</i>,<i>O</i>')hafnium(IV) toluene disolvate |
Authors of publication |
Viljoen, J. Augustinus; Muller, Alfred; Roodt, Andreas |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2008 |
Journal volume |
64 |
Journal issue |
6 |
Pages of publication |
m838 - m839 |
a |
22.4983 ± 0.0015 Å |
b |
8.0642 ± 0.0005 Å |
c |
22.712 ± 0.002 Å |
α |
90° |
β |
118.211 ± 0.002° |
γ |
90° |
Cell volume |
3631.2 ± 0.5 Å3 |
Cell temperature |
100 ± 2 K |
Ambient diffraction temperature |
100 ± 2 K |
Number of distinct elements |
5 |
Space group number |
15 |
Hermann-Mauguin space group symbol |
C 1 2/c 1 |
Hall space group symbol |
-C 2yc |
Residual factor for significantly intense reflections |
0.0185 |
Weighted residual factors for all reflections included in the refinement |
0.0419 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.074 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2218446.html