Information card for entry 2218895
| Chemical name |
(1<i>E</i>,4<i>E</i>)-1,5-Bis(4-methylphenyl)penta-1,4-dien-3-one |
| Formula |
C19 H18 O |
| Calculated formula |
C19 H18 O |
| SMILES |
O=C(/C=C/c1ccc(cc1)C)/C=C/c1ccc(cc1)C |
| Title of publication |
(1<i>E</i>,4<i>E</i>)-1,5-Bis(4-methylphenyl)penta-1,4-dien-3-one |
| Authors of publication |
Arshad, Muhammad Nadeem; Tahir, Muhammad Nawaz; Asghar, Muhammad Nadeem; Khan, Islam Ullah; Ashfaq, Muhammad |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2008 |
| Journal volume |
64 |
| Journal issue |
8 |
| Pages of publication |
o1413 |
| a |
19.937 ± 0.002 Å |
| b |
5.8637 ± 0.0005 Å |
| c |
14.9207 ± 0.0014 Å |
| α |
90° |
| β |
121.001 ± 0.003° |
| γ |
90° |
| Cell volume |
1495.1 ± 0.2 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
5 |
| Hermann-Mauguin space group symbol |
C 1 2 1 |
| Hall space group symbol |
C 2y |
| Residual factor for all reflections |
0.0671 |
| Residual factor for significantly intense reflections |
0.0475 |
| Weighted residual factors for significantly intense reflections |
0.1218 |
| Weighted residual factors for all reflections included in the refinement |
0.1369 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.036 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKαradiation |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2218895.html