Information card for entry 2219113
| Chemical name |
5,6-Dioxo-1,10-phenanthrolin-1-ium trifluoromethanesulfonate |
| Formula |
C13 H7 F3 N2 O5 S |
| Calculated formula |
C13 H7 F3 N2 O5 S |
| SMILES |
S(=O)(=O)([O-])C(F)(F)F.O=C1c2ccc[nH+]c2c2ncccc2C1=O |
| Title of publication |
5,6-Dioxo-1,10-phenanthrolin-1-ium trifluoromethanesulfonate |
| Authors of publication |
Onuegbu, Jonathan; Butcher, Ray J.; Hosten, Charles; Udeochu, Uche Charles; Bakare, Oladapo |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2008 |
| Journal volume |
64 |
| Journal issue |
8 |
| Pages of publication |
o1543 |
| a |
6.4896 ± 0.0002 Å |
| b |
16.3963 ± 0.0005 Å |
| c |
13.243 ± 0.0003 Å |
| α |
90° |
| β |
94.393 ± 0.002° |
| γ |
90° |
| Cell volume |
1404.99 ± 0.07 Å3 |
| Cell temperature |
200 ± 2 K |
| Ambient diffraction temperature |
200 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.0576 |
| Residual factor for significantly intense reflections |
0.0342 |
| Weighted residual factors for significantly intense reflections |
0.0701 |
| Weighted residual factors for all reflections included in the refinement |
0.0765 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.936 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2219113.html