Information card for entry 2219126
Chemical name |
6,6',6'',6'''-tetramethoxy-2,2',2'',2'''- [methanetetrayltetrakis(methylenenitrilomethylidyne)]tetraphenol |
Formula |
C37 H40 N4 O8 |
Calculated formula |
C37 H40 N4 O8 |
SMILES |
COc1cccc(c1O)/C=N/CC(C/N=C/c1cccc(c1O)OC)(C/N=C/c1cccc(c1O)OC)C/N=C/c1cccc(c1O)OC |
Title of publication |
A four-armed Schiff base: 6,6',6'',6'''-tetramethoxy-2,2',2'',2'''-[methanetetrayltetrakis(methylenenitrilomethylidyne)]tetraphenol |
Authors of publication |
Jiang, Guang-Qi; Cai, Jie; Zhang, Yun-Qian; Zhang, Qian-Jun |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2008 |
Journal volume |
64 |
Journal issue |
8 |
Pages of publication |
o1455 |
a |
11.3464 ± 0.0011 Å |
b |
12.4437 ± 0.0012 Å |
c |
13.0523 ± 0.0014 Å |
α |
75.861 ± 0.007° |
β |
88.893 ± 0.007° |
γ |
78.385 ± 0.007° |
Cell volume |
1749.6 ± 0.3 Å3 |
Cell temperature |
273 ± 2 K |
Ambient diffraction temperature |
273 ± 2 K |
Number of distinct elements |
4 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.1182 |
Residual factor for significantly intense reflections |
0.0536 |
Weighted residual factors for significantly intense reflections |
0.12 |
Weighted residual factors for all reflections included in the refinement |
0.1451 |
Goodness-of-fit parameter for all reflections included in the refinement |
0.938 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2219126.html