Information card for entry 2219785
Chemical name |
1,3,4,6-Tetrachloro-7,7-bis(4-chlorophenyl)bicyclo[4.2.0]oct-3-ene-2,5-dione |
Formula |
C20 H10 Cl6 O2 |
Calculated formula |
C20 H10 Cl6 O2 |
SMILES |
ClC1=C(Cl)C(=O)[C@]2(Cl)[C@](Cl)(C1=O)C(C2)(c1ccc(Cl)cc1)c1ccc(Cl)cc1.ClC1=C(Cl)C(=O)[C@@]2(Cl)[C@@](Cl)(C1=O)C(C2)(c1ccc(Cl)cc1)c1ccc(Cl)cc1 |
Title of publication |
1,3,4,6-Tetrachloro-7,7-bis(4-chlorophenyl)bicyclo[4.2.0]oct-3-ene-2,5-dione |
Authors of publication |
Hu, Huayou; Li, Lei; Ji, Jun-Feng; Shen, Zhi-Guo |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2008 |
Journal volume |
64 |
Journal issue |
11 |
Pages of publication |
o2151 |
a |
8.671 ± 0.0017 Å |
b |
9.685 ± 0.0019 Å |
c |
12.864 ± 0.003 Å |
α |
105.49 ± 0.03° |
β |
97.11 ± 0.03° |
γ |
102.68 ± 0.03° |
Cell volume |
996.4 ± 0.4 Å3 |
Cell temperature |
293 ± 2 K |
Ambient diffraction temperature |
293 ± 2 K |
Number of distinct elements |
4 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.094 |
Residual factor for significantly intense reflections |
0.0661 |
Weighted residual factors for significantly intense reflections |
0.1515 |
Weighted residual factors for all reflections included in the refinement |
0.1921 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.005 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2219785.html