Information card for entry 2220525
Chemical name |
(3aR,8aR)-2,2,6,6-Tetramethyl-4,4,8,8-tetraphenyltetrahydro-1,3- dioxolo[4,5-<i>e</i>][1,3,2]dioxasilepine |
Formula |
C33 H34 O4 Si |
Calculated formula |
C33 H34 O4 Si |
Title of publication |
(3a<i>R</i>,8a<i>R</i>)-2,2,6,6-Tetramethyl-4,4,8,8-tetraphenyltetrahydro-1,3-dioxolo[4,5-<i>e</i>][1,3,2]dioxasilepine |
Authors of publication |
Hijji, Yousef M.; Hudrlik, Paul F.; Hudrlik, Anne M.; Butcher, Ray J.; Jasinski, Jerry P. |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2009 |
Journal volume |
65 |
Journal issue |
1 |
Pages of publication |
o135 |
a |
10.008 ± 0.002 Å |
b |
17.081 ± 0.003 Å |
c |
17.271 ± 0.003 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
2952.4 ± 0.9 Å3 |
Cell temperature |
293 ± 2 K |
Ambient diffraction temperature |
293 ± 2 K |
Number of distinct elements |
4 |
Space group number |
19 |
Hermann-Mauguin space group symbol |
P 21 21 21 |
Hall space group symbol |
P 2ac 2ab |
Residual factor for all reflections |
0.115 |
Residual factor for significantly intense reflections |
0.0544 |
Weighted residual factors for significantly intense reflections |
0.0965 |
Weighted residual factors for all reflections included in the refinement |
0.1191 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.039 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
Yes |
Has Fobs |
Yes |
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https://www.crystallography.net/2220525.html