Information card for entry 2220775
| Chemical name |
<i>N</i>,<i>N</i>'-Bis[(<i>E</i>)-quinoxalin-2-ylmethylidene]ethane-1,2-diamine |
| Formula |
C20 H16 N6 |
| Calculated formula |
C20 H16 N6 |
| SMILES |
C(/N=C/c1cnc2c(n1)cccc2)C/N=C/c1cnc2c(n1)cccc2 |
| Title of publication |
<i>N</i>,<i>N</i>'-Bis[(<i>E</i>)-quinoxalin-2-ylmethylidene]ethane-1,2-diamine |
| Authors of publication |
Varghese, Digna; Arun, V.; Sebastian, Manju; Leeju, P.; Varsha, G.; Yusuff, K. K. M. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2009 |
| Journal volume |
65 |
| Journal issue |
2 |
| Pages of publication |
o435 |
| a |
6.888 ± 0.002 Å |
| b |
7.381 ± 0.003 Å |
| c |
9.638 ± 0.004 Å |
| α |
101.674 ± 0.006° |
| β |
96.233 ± 0.006° |
| γ |
116.046 ± 0.005° |
| Cell volume |
420.1 ± 0.3 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0837 |
| Residual factor for significantly intense reflections |
0.0714 |
| Weighted residual factors for significantly intense reflections |
0.1584 |
| Weighted residual factors for all reflections included in the refinement |
0.1643 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.268 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2220775.html