Information card for entry 2221045
Chemical name |
(<i>E</i>)-<i>N</i>,<i>N</i>'-Bis(2,6-dimethylphenyl)-<i>N</i>,<i>N</i>'- bis(trichlorosilyl)ethylene-1,2-diamine |
Formula |
C18 H20 Cl6 N2 Si2 |
Calculated formula |
C18 H20 Cl6 N2 Si2 |
SMILES |
C(=C\N(c1c(cccc1C)C)[Si](Cl)(Cl)Cl)/N([Si](Cl)(Cl)Cl)c1c(C)cccc1C |
Title of publication |
(<i>E</i>)-<i>N</i>,<i>N</i>'-Bis(2,6-dimethylphenyl)-<i>N</i>,<i>N</i>'-bis(trichlorosilyl)ethylene-1,2-diamine |
Authors of publication |
Yang, Wei; Zhang, Ming; Liu, Guangyan; Ding, Yuqiang |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2009 |
Journal volume |
65 |
Journal issue |
3 |
Pages of publication |
o625 |
a |
8.1858 ± 0.0003 Å |
b |
8.4249 ± 0.0003 Å |
c |
10.6074 ± 0.0004 Å |
α |
74.583 ± 0.003° |
β |
79.999 ± 0.002° |
γ |
62.243 ± 0.002° |
Cell volume |
623 ± 0.04 Å3 |
Cell temperature |
273 ± 2 K |
Ambient diffraction temperature |
273 ± 2 K |
Number of distinct elements |
5 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.0729 |
Residual factor for significantly intense reflections |
0.0589 |
Weighted residual factors for significantly intense reflections |
0.1781 |
Weighted residual factors for all reflections included in the refinement |
0.2022 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.108 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2221045.html