Information card for entry 2221828
Chemical name |
(20<i>R</i>,24<i>R</i>,25<i>S</i>)-3α,7α,12α,27-Tetraacetoxy-24,26-epoxy- 5β-cholestane |
Formula |
C35 H54 O9 |
Calculated formula |
C35 H54 O9 |
SMILES |
O([C@H]1C[C@@H]2[C@](CC1)([C@@H]1[C@@H]([C@H](OC(=O)C)C2)[C@H]2[C@@]([C@@H](OC(=O)C)C1)(C)[C@H](CC2)[C@H](C)CC[C@H]1OC[C@@H]1COC(=O)C)C)C(=O)C |
Title of publication |
(20<i>R</i>,24<i>R</i>,25<i>S</i>)-3α,7α,12α,27-Tetraacetoxy-24,26-epoxy-5β-cholestane |
Authors of publication |
Ketuly, Kamal Aziz; A. Hadi, A. Hamid; Ng, Seik Weng |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2009 |
Journal volume |
65 |
Journal issue |
5 |
Pages of publication |
o1026 |
a |
10.9474 ± 0.0002 Å |
b |
14.7638 ± 0.0002 Å |
c |
20.4477 ± 0.0003 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
3304.86 ± 0.09 Å3 |
Cell temperature |
100 ± 2 K |
Ambient diffraction temperature |
100 ± 2 K |
Number of distinct elements |
3 |
Space group number |
19 |
Hermann-Mauguin space group symbol |
P 21 21 21 |
Hall space group symbol |
P 2ac 2ab |
Residual factor for all reflections |
0.0359 |
Residual factor for significantly intense reflections |
0.0318 |
Weighted residual factors for significantly intense reflections |
0.0825 |
Weighted residual factors for all reflections included in the refinement |
0.0852 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.005 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2221828.html