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Information card for entry 2223742
Preview
| Coordinates | 2223742.cif |
|---|---|
| Original IUCr paper | HTML |
| Chemical name | 2-(4-Chloro-3-nitrophenyl)-4-(4-chlorophenyl)-1,3-thiazole |
|---|---|
| Formula | C15 H8 Cl2 N2 O2 S |
| Calculated formula | C15 H8 Cl2 N2 O2 S |
| SMILES | s1c(nc(c2ccc(Cl)cc2)c1)c1cc(N(=O)=O)c(Cl)cc1 |
| Title of publication | 2-(4-Chloro-3-nitrophenyl)-4-(4-chlorophenyl)-1,3-thiazole |
| Authors of publication | Nayak, Susanta K.; Venugopala, K. N.; Chopra, Deepak; Govender, Thavendran; Kruger, Hendrik G.; Maguire, Glenn E. M.; Guru Row, T. N. |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2009 |
| Journal volume | 65 |
| Journal issue | 11 |
| Pages of publication | o2611 - o2612 |
| a | 7.4379 ± 0.0019 Å |
| b | 12.305 ± 0.003 Å |
| c | 16.808 ± 0.004 Å |
| α | 88.596 ± 0.005° |
| β | 84.131 ± 0.004° |
| γ | 76.721 ± 0.005° |
| Cell volume | 1489.3 ± 0.6 Å3 |
| Cell temperature | 292 ± 2 K |
| Ambient diffraction temperature | 292 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1229 |
| Residual factor for significantly intense reflections | 0.0583 |
| Weighted residual factors for significantly intense reflections | 0.1122 |
| Weighted residual factors for all reflections included in the refinement | 0.1304 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.972 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/2223742.html
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Users of the data should acknowledge the original authors of the
structural data.