Information card for entry 2224972
| Chemical name |
(1<i>E</i>,4<i>E</i>)-1,5-Bis(2,4,5-trimethoxyphenyl)penta-1,4-dien-3-one |
| Formula |
C23 H26 O7 |
| Calculated formula |
C23 H26 O7 |
| SMILES |
COc1cc(OC)c(cc1/C=C/C(=O)/C=C/c1cc(OC)c(cc1OC)OC)OC |
| Title of publication |
(1<i>E</i>,4<i>E</i>)-1,5-Bis(2,4,5-trimethoxyphenyl)penta-1,4-dien-3-one |
| Authors of publication |
Fun, Hoong-Kun; Ruanwas, Pumsak; Chantrapromma, Suchada |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2010 |
| Journal volume |
66 |
| Journal issue |
2 |
| Pages of publication |
o307 - o308 |
| a |
9.4157 ± 0.0001 Å |
| b |
36.8613 ± 0.0005 Å |
| c |
19.1226 ± 0.0003 Å |
| α |
90° |
| β |
107.737 ± 0.001° |
| γ |
90° |
| Cell volume |
6321.49 ± 0.15 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.1062 |
| Residual factor for significantly intense reflections |
0.0668 |
| Weighted residual factors for significantly intense reflections |
0.1295 |
| Weighted residual factors for all reflections included in the refinement |
0.1498 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.056 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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