Information card for entry 2226057
| Chemical name |
{3,3',5,5'-Tetramethoxy-2,2'-[ethane-1,2- diylbis(nitrilomethylidyne)]diphenolato}nickel(II) |
| Formula |
C20 H22 N2 Ni O6 |
| Calculated formula |
C20 H22 N2 Ni O6 |
| SMILES |
[Ni]123Oc4cc(cc(OC)c4C=[N]2CC[N]3=Cc2c(cc(OC)cc2O1)OC)OC |
| Title of publication |
{3,3',5,5'-Tetramethoxy-2,2'-[ethane-1,2-diylbis(nitrilomethylidyne)]diphenolato}nickel(II) |
| Authors of publication |
Assey, Gervas E.; Butcher, Ray J.; Gultneh, Yilma |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2010 |
| Journal volume |
66 |
| Journal issue |
6 |
| Pages of publication |
m620 |
| a |
7.41599 ± 0.00012 Å |
| b |
15.6945 ± 0.0002 Å |
| c |
15.7203 ± 0.0002 Å |
| α |
90° |
| β |
91.9153 ± 0.0013° |
| γ |
90° |
| Cell volume |
1828.67 ± 0.04 Å3 |
| Cell temperature |
110 ± 2 K |
| Ambient diffraction temperature |
110 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0383 |
| Residual factor for significantly intense reflections |
0.0361 |
| Weighted residual factors for significantly intense reflections |
0.0966 |
| Weighted residual factors for all reflections included in the refinement |
0.0981 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.042 |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2226057.html